Manufacturer: Aspex
Model: Explorer
Description: A focused beam of electrons to produces a high resolution image of a sample in the range of a few nanometers, as well as other signals containing topographical and compositional information.
Key Features: 2-25 kV e-beam, equipped with a secondary electron detector, quad back scatter electron detectors, x-ray detector, variable pressure mode allows imaging of some insulating samples.
Material Restrictions: Clean, dry, low-outgassing substrates, must be stable under mechanical vacuum, sputter coating of insulating samples may be necessary.

​General Information: A scanning electron microscope (SEM) is a high power microscope which utilizes a column of electrons to image a sample. Secondary and back-scattered electrons ejected by the sample are collected by a detector to form an image. Many SEM's are also able to determine the composition of a sample using an x-ray detector (EDS).​

Manufacturer: Olympus
Model: Fluoview FV10i
Description: Solid-state laser diodes with four different excitation wavelengths are absorbed by the sample, and the resulting optical fluorescence is collected thru a confocal aperture by photomultiplier tubes.  As the lasers scans across the sample a fluorescent image is created.
Key Features: 450 nm, 535 nm, 570 nm, and 620 nm laser lines, equipped with a 10x and 60x oil-immersion objective lenses, photomultiplier tube fluorescent photon detectors, and a fully enclosed, vibration isolated bench-mount system. 2-D images, multiple Z-stack 3-D images, z-stack over time, and multiple-area imaging modes.
​Material Restrictions: Samples must fluoresce when excited by the laser wavelengths.  Samples must be mounted on standard 1 x 3 microscope slides with #1.5 coverslips.  Sample cells can be living or fixed.  Many natural materials autofluoresce, while others will require a fluorescent stain that can highlight specific cell structures.

​General Information: A laser scanning confocal microscope is primarily used to image biological samples. A laser irradiates the sample, and the resulting fluorescent photons are collected to from an image. Confocal microscopes can take image "slices" which can be stitched together to make a 3D picture.​

Manufacturer: Bruker
Model: DektakXT
Instrument Type: Profilometer
Description: Surface contact profilometer equipped with a 2.0 µm radius stylus.  The stylus runs over the sample, and is deflected by height changes in the sample surface topology.  An electronic capacitive sensing mechanism detects tip height changes.
Key Features: 2.0 µm diamond-tip stylus.  Z-Resolution as low as 5 Å, x-y scan sizes up to 55 mm x 55 mm.  Linear step height scans, and 3D stitching capability.  Equipped with a NIST-certified reference standard.
​Material Restrictions: Samples must be dry and locally flat to a couple of millimeters.  Sample stage is 22 cm x 22 cm.  Sample material must be mechanically robust to prevent the tip from scratching the sample surface.

​General Information: A profilometer is primarily used to measure step heights in the micron and nanometer size range. A stylus is moved over the sample. As it traces across the surface, the movement up and down is recorded as height.​

Manufacturer: NanoSurf
Model: EasyScan 2
Description: Used to characterize topographical and material properties using a cantilever and measuring its deflection with a laser while scanning over the sample surface in one of several modes.
Key Features: High resolution 3D topographical imaging w/ a range of 70 μm-xy, Z 14 μm-z and resolution of 1.1 nm-xy, 0.21 nm-z.
Modes: Contact modes: Static Force, Constant Force, Constant Height; Tapping Modes: Contrast Dynamic Force, Constant Amplitude, Constant Frequency, Phase Contrast.
​Materials Restrictions: Samples must be locally flat to within 500 nm and must fit on a standard 12.7 mm AFM puck.

​General Information: An atomic force microscope (AFM) can resolve features down to 1 nm or below. AFM's work by moving a tip across the surface of a sample and measuring the deflections of the tip though a feedback loop. The famous IBM Quantum Corral and the video A Boy and His Atom were created using an instrument similar to an AFM.

Manufacturer: Reichert
Model: EpiStar 2560
Description: Used for IC inspection, examination of metallic grain structures, as well as studying composite materials.
Key Features: Magnification: 65x – 400x, Moticam 2000 2MP camera for image capture.
Materials Restrictions: Translucent and opaque specimens possible, specimen height less than 1 cm is necessary.

​General Information: A metallographic microscope is an optical microscope specifically designed for imaging metals. The microscope can illuminate the samples from above and collect the light reflected off the sample. This allows a metallographic microscope to image opaque samples such as metals, and microchips.

Manufacturer: Malvern
Model: Zetasizer Nano ZS
Description: Used for particle/molecular size and zeta potential measurements of small or dilute samples, and samples at very low or high concentration.
Key Features: Particle/Molecular size measurement range: 0.3nm – 10.0 microns (diameter). Zeta Potential measurement range: 3.8nm – 100 microns (diameter).
Materials Restrictions: Minimum sample volume of 1mL for size measurements and 150 microliters for zeta potential measurements. Sample concentrations should be between 0.1ppm to 40%w/v.​

​General Information: DLS is used to measure particle and molecule size. This technique measures the diffusion of particles moving under Brownian motion, and converts this to size and a size distribution using the Stokes-Einstein relationship.​​

Manufacturer: Signatone
Model: S-1160
Description:  A multi-purpose analytical platform designed to support a broad range of precision probing applications, including RF probing, low current (femtoamp range) probing, failure analysis, thermal probing.
Key Features: Supports up to 6" wafers. Equipped with Motic Motic PSM-1000 Microscope. Magnification: 20-400x.
Materials Restrictions:

​General Information: Probe stations are used to measure signals from a semiconductor device. Micropositioners are used for precise positioning of thin needles on the surface of the device. Probe stations are often used for testing new devices, quality control, and failure analysis.

Manufacturer: Lucas Labs
Model: S-302-4 Resistivity Probe Stage
Description: Used to measure sheet resistivity on samples with flat surfaces. Utilizes four points probe head with superior accuracy compared to a two point probe test.
​Key Features: SP4 four point probe head, 4 inch Teflon isolation test disk.
Materials Restrictions: Sample must be flat to obtain accurate measurements and fit on 4 inch test disk.

​General Information: A four point probe stage is used to measure the sheet resistivity of thin films. Many thin films used in nanotechnology are highly conductive. Typical voltmeters will give an inaccurate resistance measurement for these types of films. Four point probes have separate terminals for voltage and current, and can give a more accurate resistance value.

Manufacturer: AST Products
Model: VCA Optima
Description: Used to measure the contact angle of various liquids with a sample surface for surface energy analysis. Applications include evaluation of surface cleanliness, wetting behavior, bond quality, adhesion, absorption, surface treatments and coatings.
Key Features: Static contact angle analysis, motorized syringe for advancing and receding contact angle analysis, dynamic capture for high speed image capture, pendant drop analysis, and surface energy analysis.
​Materials Restrictions: Sample must be less than 8L x 8W x 8H cm.

​General Information: A contact angle goniometer is used to understand the interfacial properties of solid and liquid materials. Quantifiable information is obtained to build an understanding of trends seen with different surface coatings. The obtained contact angle also gives information that can be used to determine surface tension and surface energy of a material.

Manufacturer: Solar Light
Model: 16S
Description: Used to accurately replicate full spectrum sunlight for the testing of photovoltaic cells, polymers, sun screens, and other materials and devices. 
Features: AM1.5G spectrum, typical spot size of 2.25 inch @ 1 sun output intensity, Class A spectrum solar simulator, and meets the latest ASTM standards.
​Materials Restrictions: Materials sensitive to UV degradation.

​General Information: A solar simulator has a high-powered lamp and filter system that outputs a spectrum of light which is close to the solar spectrum. Solar simulators are used to test solar cells.