|
Nano Surf Easy Scan 2 AFM |
 |
 |
 |
|
|
|
|
Manufacturer
|
Nano Surf
|
|
Model
|
Easy Scan 2
|
|
Instrument Type
|
Atomic Force Microscope
|
|
Description
|
Used to characterize topographical and material properties using a cantilever and measuring its deflection with a laser while scanning over the sample surface in one of several modes.
|
|
Key Features
|
High resolution 3D topographical imaging w/ a range of 70 ╬╝m-xy, Z 14 ╬╝m-z and resolution of 1.1 nm-xy, 0.21 nm-z.
|
| Modes |
Static Force, Constant Force, Dynamic Force, Constant Height, Constant Amplitude, Phase Contrast
|
|
Material Restrictions
|
Samples must be locally flat to within 500 nm and must fit on a standard 12.7 mm AFM puck.
|
|
