Aspex EXplorer SEM / EDS




A scanning electron microscope (SEM) is a high power microscope which utilizes a column of electrons to image a sample.

Secondary and back-scattered electrons ejected by the sample are collected by a detector to form an image.

Many SEM's are also able to determine the composition of a sample using an x-ray detector (EDS).


Contact Us

For questions about the NSC Nanotechnology program including courses and program options, please contact the SHINE Center Director at 

For questions about nanotechnology internships or careers in nanotechnology, please contact the SHINE Employment & Internship Specialist at

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