Aspex EXplorer SEM / EDS

aspex-explorer

 

 

A scanning electron microscope (SEM) is a high power microscope which utilizes a column of electrons to image a sample.

Secondary and back-scattered electrons ejected by the sample are collected by a detector to form an image.

Many SEM's are also able to determine the composition of a sample using an x-ray detector (EDS)

 

Learn More about TAC

For more information about the Nanotechnology Technical Advisory Committee, please contact the SHINE Recruitment & Employment Specialist
shine@northseattle.edu

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