Aspex EXplorer SEM / EDS




A scanning electron microscope (SEM) is a high power microscope which utilizes a column of electrons to image a sample.

Secondary and back-scattered electrons ejected by the sample are collected by a detector to form an image.

Many SEM's are also able to determine the composition of a sample using an x-ray detector (EDS).


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For more information about the Nanotechnology Technical Advisory Committee, please contact the SHINE Employment & Internship Specialist at

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