Aspex EXplorer SEM / EDS




A scanning electron microscope (SEM) is a high power microscope which utilizes a column of electrons to image a sample.

Secondary and back-scattered electrons ejected by the sample are collected by a detector to form an image.

Many SEM's are also able to determine the composition of a sample using an x-ray detector (EDS).


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For general inquiries, comments, and information, contact us at

For questions about the NSC Nanotechnology lab, please contact the SHINE Managing Director at 

For questions about the NSC Nanotechnology internship program, please contact the SHINE Employment & Internship Specialist at

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