Aspex EXplorer SEM / EDS

aspex-explorer

 

 

A scanning electron microscope (SEM) is a high power microscope which utilizes a column of electrons to image a sample.

Secondary and back-scattered electrons ejected by the sample are collected by a detector to form an image.

Many SEM's are also able to determine the composition of a sample using an x-ray detector (EDS).

 

Schedule a Program

For more information or to schedule a program, contact:

Maureen Devery
Outreach Manager
206.934.7014
mdevery@northseattle.edu

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