Aspex EXplorer SEM / EDS




A scanning electron microscope (SEM) is a high power microscope which utilizes a column of electrons to image a sample.

Secondary and back-scattered electrons ejected by the sample are collected by a detector to form an image.

Many SEM's are also able to determine the composition of a sample using an x-ray detector (EDS).


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For general inquiries, comments, and information, contact us at

To request materials, please contact the SHINE Program Coordinator at

For questions about Remote Access use or to schedule a session, please contact the SHINE Nanotechnology Lab Technician at

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